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Lecturer(s)
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Novák Ondřej, prof. Ing. CSc.
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Course content
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The subject provides deeper knowledge about system reliability, design for testability of integrated circuits and about the methods of integrated circuit testing and diagnosis. The main topics of the subject are: Fault models for digital systems, test generation for combinational and sequential circuits, test set minimization, fault simulation, signature analysis, built-in self-test, testing LSI and VLSI circuits, hardware for diagnostics, reliability estimation and modeling, fault tolerant systems.
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Learning activities and teaching methods
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Monological explanation (lecture, presentation,briefing)
- Class attendance
- 40 hours per semester
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Learning outcomes
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The subject provides deeper knowledge about system reliability, design for testability of integrated circuits and about the methods of integrated circuit testing and diagnosis. The main topics of the subject are: Fault models for digital systems, test generation for combinational and sequential circuits, test set minimization, fault simulation, signature analysis, built-in self-test, testing LSI and VLSI circuits, hardware for diagnostics, reliability estimation and modeling, fault tolerant systems.
Theoretic piece of knowledge and practical skills from requered areas
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Prerequisites
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Digital Computers subject knowledge is supposed.
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Assessment methods and criteria
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Written exam
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Recommended literature
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HLAVIČKA, J. Diagnostika a spolehlivost - cvičení. Praha, Vydavatelství ČVUT, 1998. ISBN 80-01-01714-1.
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HLAVIČKA, J. Diagnostika a spolehlivost.. Praha, Vydavatelství ČVUT, 1998. ISBN 80-01-01846-6.
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Novák, O, Gramatová, E., Ubar, R. Handbook of Electronic Testing.. Vydavatelství ČVUT, 2005. ISBN 80-01-03318-X.
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