Lecturer(s)
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Vodičková Věra, doc. RNDr. Ph.D.
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Course content
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1. Introduction, requirements for the credit, rules of safety at work in the laboratory. 2. - 3. Practical applications of SEM. Surface classification of textile materials, the measurement of the fibre diameter. Surface classification of composite materials, fibre and particle composite - the measurement of the fibre diameter, the measurement of the fibre diameter, the measurement of particles size. 4. - 5. Practical applications of SEM with EDX analyse. Local elemental analysis of metallic materials. Local elemental analysis of non-metallic materials. 6. - 7. Practical applications of spectroscopic methods. LIBS - Laser Induced Breakdown Spectroscopy. Spectral analyse of textile materials. Spectral analyse of metallic materials. 8. - 9. Practical applications of Scanning Probe Methods. Surface analyse of materials by Atomic Force Microscope. 10. - 11. Methods of X-ray diffraction. Structure analyse of crystalline materials. 12. - 13. Methods of surface analyse 14. Credit
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Learning activities and teaching methods
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Written assignment presentation and defence
- Class attendance
- 56 hours per semester
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Learning outcomes
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Practical skills obtaining for applications of base analytic methods.
Practical skills obtaining for applications of base analytic methods.
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Prerequisites
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Knowledge of base analytic methods principles and utilization (graduation of subject Methods of nanomaterials characterization 1).
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Assessment methods and criteria
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Presentation of acquired knowledge via paper
Klasifikovaný zápočet
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Recommended literature
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ASM Metals HandBook Volume 10 - Materials Characterization.
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BRUNDLE C. R., EVANS C.A., WILSON, S. Encyclopedia of Materials Characterization.
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HRIVŇÁK I. Elektrónová mikroskopia ocelí, VEDA Bratislava 1986.
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JANDOŠ,F.,ŘÍMAN,R.,GEMPERLE,A.:. Využití moderních laboratorních metod v metalografii. SNTL Praha, 1985.
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KRAUS I.:. Úvod do strukturní rentgenografie, Academia Praha, 1985.
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SKOČOVSKÝ P., ŠIMAN I. Štruktúrna analýza liatin,ALFA Bratislava,1989.
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