Lectures 1. Introduction. Methods of structural analysis - imaging and analytical methods. Application fields of these methods. 2. Grounding of electron microscopy. The electron beam interaction with solids matter, electron scatter mechanism, electron emission from the sample. 3. REM - the principles of scanning electron microscopy, basic constructional elements, types of contrast, imaging interpretation. 4. TEM - the principles of transmission electron microscopy, basic constructional elements, types of contrasts, imaging interpretation. Diffraction contrast, interpretation of diffraction imaging. 5. The scanning probe microscopy. The general principle. Parting of methods based on type of interaction. Principle and using of scanning tunnelling microscopy (STM), atom force microscopy (AFM) and others. 6. Special microscopic methods - FEM, FIM, SNOM 7. Grounding of chemical analysis methods. Light emission spectroscopy - formation and registration of atomic spectrum. The classical method of Light emission spectroscopy. The spectroscopy instruments - classical and modern. 8. Methods of Automatic emission analysis of metals. GDOES, ICP. 9. The special spectroscopic methods - LIBS, RAMAN, X-ray fluorescence 10. The electron microanalysis. Principles of method. The energy disperisve analysis (EDAX), wave dispersive analysis (WDAX). The methods of analysis. 11. X-ray crystallography. The X-ray origination and properties, X-ray interaction with solid matter. The diffraction on the crystal lattice. Bragg's equation, Laue's equations, Ewald's construction. 12. The special diffraction methods - principles and applications EBSD, LEED 13. The surface analysis methods. The general principles, most common methods - Auger electron spectroscopy (AES), SIMS, XPS (ESCA). Principle of Auger electron spectroscopy, XPS, SIMS. Practice 1. Introduction, requirements for the credit, study literature 2. The sample preparation for SEM 3. - 4. The observation by SEM, SE and BSE detector applications, the effect of observation conditions 5. Methods of TEM samples preparation (replics, foils, FIB). 6. AFM - demonstration, applications 7. -8. LIBS spectrometer, demonstration of spectral measurement 9. - 10. Energy dispersive spectrometer, connection with SEM (TEM), applications 11. Experimental methods of diffraction analysis. Methods for monocrystalline and polycrystaline materials study. X-ray diffractometers, applications. 12.-13. Methods of surface analysis 14. Credit
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ASM Metals HandBook Volume 10 - Materials Characterization.
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BRUNDLE C. R., EVANS C.A., WILSON, S. Encyclopedia of Materials Characterization.
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HRIVŇÁK,I. Elektrónová mikroskópia ocelí. VEDA Bratislava, 1986.
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KRAUS I.:. Úvod do strukturní rentgenografie, Academia Praha, 1985.
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SKOČOVSKÝ P., ŠIMAN I. Štruktúrna analýza liatin,ALFA Bratislava,1989.
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